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| | Name : | Sue Sautermeister | Organization : | N/A | Post Date : | 9/15/2005 |
| Section : | A2A | Page no. : | 8 | Line no.: | | Comment : | [Volume II, Section A]
Page A 8
• Stress tests: These tests investigate the system's response to transient overload conditions. Polling place devices shall be subjected to ballot processing at the high volume rates at which the equipment can be operated to evaluate software response to hardware-generated interrupts and wait states. Central counting systems shall be subjected to similar overloads, including, for systems that support more than one card reader, continuous processing through all readers simultaneously;
Typo of “central” | |
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